Bruker Innova Afm Manual ((hot)) Link

Performing a "probe approach" to bring the tip into contact or near-contact with the surface.

Calibration > X/Y Nonlinearity. Root cause: The scanner’s capacitive sensors need recalibration. Solution: The manual provides a step-by-step calibration using a certified 2D grid standard (e.g., a 1µm pitch grating). You will edit the cal file ( innova_cal.dat ) under NanoScope’s hidden directories. bruker innova afm manual

Troubleshooting > Noisy Scan Artifacts. Root cause: Setpoint too high in TappingMode, causing tip disengagement. Or, the integral gain is too low. Solution: The manual provides a gain-tuning procedure: Increase integral gain until faint “ringing” appears at scan turns, then back off by 10%. Also check the scanner’s “fast” X-axis direction. Performing a "probe approach" to bring the tip